Lehrende/r: Univ.-Prof. Dr. Hans-Joachim Elmers; Jun.-Prof. Dr. Stefan Weber
Veranstaltungsart: Vorlesung/Übung
Anzeige im Stundenplan: Ausgew.Kapitel d.Fes
Semesterwochenstunden: 4
Credits: 6,0
Unterrichtssprache: Englisch
Min. | Max. Teilnehmerzahl: - | -
Voraussetzungen / Organisatorisches: Experimentalphysik 5c (Physik kondensierter Materie)
Inhalt: Oberflächenabbildung mit Rastersondenmikroskopie/Imaging surfaces with scanning probe microscopy The lecture will introduce into the basic principles and the physics behind scanning tunneling microscopy (STM) and scanning/atomic force microscopy (AFM). I. Scanning tunneling microscopy I.A Basics (Quantum mechanics, tunneling effect, s-wave model, resolution limits) I.B Experimental details (Instrumentation, mechanical decoupling, feed-back loops) I.C Spectroscopy (Small/large field models, surface states, image potential states, impurity spectroscopy, surface alloys) I.D Thermo-voltage (Seebeck effect, noise spectroscopy) I.E Spin-polarized STM ( ferromagnets. Antiferromagnets, superconductors) I.F Time-resolved STM (Instrumentation, Dynamic processes) II Scanning force microsocpy II.A Basics (History, instrumentation, overview of operation modes) II.B tip-sample forces (van der Waals, electrostatic, chemical forces, contact mechanics, force calibration) II.C Surface topography imaging (contact mode, tapping mode, physe modulation/frequency modulation) II.D Noise limitations/atomic resolution imaging II.E Surface potential mapping (Kelvin Probe force microscopy) II.F Measuring nanoscale dynamics (High-speed AFM, time-resolved pump probe techniques)
Empfohlene Literatur: Bert Voigtländer Scanning Probe Microscopy - Atomic Force Microscopy and Scanning Tunneling Microscopy Springer (2015) Hans-Jürgen Butt, Karlheinz Graf, Michael Kappl Physics and Chemistry of Interfaces 3rd Edition, Wiley (2013)
