Instructors: apl. Prof. Dr. Martin Jourdan
Event type:
Seminar
Displayed in timetable as:
08.128.80118
Hours per week:
2
Credits:
4,0
Language of instruction:
Englisch
Min. | Max. participants:
- | -
Requirements / organisational issues:
Probing the Nanoworld: Microscopic Methods in Condensed Matter Physics.
Preliminary list of topics:
SEM(PA): scanning electron microscopy techniques - the most versatile high resolution electron microscopy (Mathias Kläui).
Scanning Tunneling Microscopy: Majorana edge modes in a ferromagnet-superconductor hybrid system (Hajo Elmers).
X-ray Photoelectron emission microscopy: Probing antiferromagnetic domains for spintronics (Martin Jourdan)
Low energy electron microscopy: Probing grain boundaries and defect structures in epitaxial thin films (Martin Jourdan).
Transmission electron microscopy: Visualizing atoms (Hajo Elmers).
Conductivity of single atoms (Gerhard Jakob).
to be continued...
Expectations for the seminar:
- Contact the supervisor of the lecture at least 4 weeks before the assigned lecture date
- Discussion of the first draft of the lecture at latest 2 weeks before the lecture
- Test talk with supervisor at least 1 week before the lecture date
- Length of presentation: 30 minutes + 10 minutes Q&A
- Language: English
The distribution of the presentation topics is via email request to jourdan@uni-mainz.de. Topics and dates for the schedule are assigned on a first-come first served basis.
Contents:
?Optical Methods
Optical methods are used very widely in solid-state physics research for the preparation, characterization and investigation of the properties of various materials and systems due to their versatility and availability. Methods range from direct imaging, to scattering and spectroscopy. In this seminar series we will explore examples of this in a range of solid state systems.
The current list of topics is available at: https://www.klaeui-lab.physik.uni-mainz.de/master-seminar-ss20/
Recommended reading list:
Will be determined with the supervisor of the presentation.
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